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Multi-environment Analysis of Yield and Quality Traits in Sugarcane (Saccharum sp.) through AMMI and GGE Biplot Analysis

V. Vinu; S. Alarmelu; K. Elayaraja; C. Appunu; G. Hemaprabha; S. Parthiban; K. Shanmugasundaram; R. Rajamadhan; K. G. Saravanan; S. Kathiravan; Bakshi Ram; V. Vinayaka; M. K. C. Varatharaj
Sugar Tech · Vol. 27, Issue 2 · pp. 540-558 · 2025
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Bibliographic Information

JournalSugar Tech
PublisherSpringer
Publication Date2025-04-01
Publication Year2025
Volume27
Issue2
Pages540-558
Document TypeJournal Article
Print ISSN0972-1525
eISSN0974-0740
DOI10.1007/s12355-024-01498-7

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NARA Access Coverage1999-01-01~Current
Journal Homepagehttps://www.springer.com/journal/12355
Publisher PageOpen Publisher Page
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