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Analysis of TaALMT1 traces the transmission of aluminum resistance in cultivated common wheat (Triticum aestivum L.)

Harsh Raman; Peter R. Ryan; Rosy Raman; Benjamin J. Stodart; Kerong Zhang; Peter Martin; Rachel Wood; Takayuki Sasaki; Yoko Yamamoto; Michael Mackay; Diane M. Hebb; Emmanuel Delhaize
Theoretical and Applied Genetics · Vol. 116, Issue 3 · pp. 343-354 · 2008
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2008-02-01
Publication Year2008
Volume116
Issue3
Pages343-354
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-007-0672-4

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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