Journal Article

Exploiting regulatory variation to identify genes underlying quantitative resistance to the wheat stem rust pathogen Puccinia graminis f. sp. tritici in barley

Arnis Druka; Elena Potokina; Zewei Luo; Nicola Bonar; Ilze Druka; Ling Zhang; David F. Marshall; Brian J. Steffenson; Timothy J. Close; Roger P. Wise; Andris Kleinhofs; Robert W. Williams; Michael J. Kearsey; Robbie Waugh

Theoretical and Applied Genetics · Vol. 117, Issue 2 · pp. 261-272 · 2008

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Bibliographic Information

Journal	Theoretical and Applied Genetics
Publisher	Springer
Publication Date	2008-07-01
Publication Year	2008
Volume	117
Issue	2
Pages	261-272
Document Type	Journal Article
Print ISSN	0040-5752
eISSN	1432-2242
DOI	10.1007/s00122-008-0771-x

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NARA Access Coverage	1929-01-01~Current
Journal Homepage	https://www.springer.com/journal/122
Publisher Page	Open Publisher Page

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