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Introgression of genes from bread wheat enhances the aluminium tolerance of durum wheat

Chang Han; Peng Zhang; Peter R. Ryan; Tina M. Rathjen; ZeHong Yan; Emmanuel Delhaize
Theoretical and Applied Genetics · Vol. 129, Issue 4 · pp. 729-739 · 2016

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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2016-04-01
Publication Year2016
Volume129
Issue4
Pages729-739
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-015-2661-3

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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