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Quantitative trait loci for resistance to stripe rust of wheat revealed using global field nurseries and opportunities for stacking resistance genes

Firdissa E. Bokore; Richard D. Cuthbert; Ron E. Knox; Harpinder S. Randhawa; Colin W. Hiebert; Ron M. DePauw; Asheesh K. Singh; Arti Singh; Andrew G. Sharpe; Amidou N’Diaye; Curtis J. Pozniak; Curt McCartney; Yuefeng Ruan; Samia Berraies; Brad Meyer; Catherine Munro; Andy Hay; Karim Ammar; Julio Huerta-Espino; Sridhar Bhavani
Theoretical and Applied Genetics · Vol. 130, Issue 12 · pp. 2617-2635 · 2017
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2017-12-01
Publication Year2017
Volume130
Issue12
Pages2617-2635
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-017-2980-7

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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