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High-resolution mapping of rachis nodes per rachis, a critical determinant of grain yield components in wheat

Kai P. Voss-Fels; Gabriel Keeble-Gagnère; Lee T. Hickey; Josquin Tibbits; Sergej Nagornyy; Matthew J. Hayden; Raj K. Pasam; Surya Kant; Wolfgang Friedt; Rod J. Snowdon; Rudi Appels; Benjamin Wittkop
Theoretical and Applied Genetics · Vol. 132, Issue 9 · pp. 2707-2719 · 2019
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2019-09-01
Publication Year2019
Volume132
Issue9
Pages2707-2719
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-019-03383-4

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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