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Journal Article

Genetic characterization of adult-plant resistance to tan spot (syn, yellow spot) in wheat

Eric G. Dinglasan; Tamaya Peressini; Kalai A. Marathamuthu; Pao Theen See; Lisle Snyman; Greg Platz; Ian Godwin; Kai P. Voss-Fels; Caroline S. Moffat; Lee T. Hickey
Theoretical and Applied Genetics · Vol. 134, Issue 9 · pp. 2823-2839 · 2021

Abstract

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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2021-09-01
Publication Year2021
Volume134
Issue9
Pages2823-2839
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-021-03861-8

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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