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High density mapping of wheat stripe rust resistance gene QYrXN3517-1BL using QTL mapping, BSE-Seq and candidate gene analysis

Shuo Huang; Yibo Zhang; Hui Ren; Xin Zhang; Rui Yu; Shengjie Liu; Qingdong Zeng; Qilin Wang; Fengping Yuan; Ravi P. Singh; Sridhar Bhavani; Jianhui Wu; Dejun Han; Zhensheng Kang
Theoretical and Applied Genetics · Vol. 136, Issue 3 · 2023
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2023-03-01
Publication Year2023
Volume136
Issue3
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-023-04282-5

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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