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Association mapping of tan spot and septoria nodorum blotch resistance in cultivated emmer wheat

Dhondup Lhamo; Qun Sun; Timothy L. Friesen; Anil Karmacharya; Xuehui Li; Jason D. Fiedler; Justin D. Faris; Guangmin Xia; Mingcheng Luo; Yong-Qiang Gu; Zhaohui Liu; Steven S. Xu
Theoretical and Applied Genetics · Vol. 137, Issue 8 · 2024
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2024-08-01
Publication Year2024
Volume137
Issue8
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-024-04700-2

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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