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Multiple environmental test and genetic mapping jointly reveal genomic loci and associated genes underlying cotton Verticillium wilt resistance

Yalin Zhang; Lihong Zhao; Ziming Li; Binhui Liu; Junyuan Lv; Zili Feng; Feng Wei; Jinglong Zhou; Jiangping Han; Yong Song; Heqin Zhu; Hongjie Feng; Zhiying Ma
Theoretical and Applied Genetics · Vol. 139, Issue 8 · 2026
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Bibliographic Information

JournalTheoretical and Applied Genetics
PublisherSpringer
Publication Date2026-08-01
Publication Year2026
Volume139
Issue8
Document TypeJournal Article
Print ISSN0040-5752
eISSN1432-2242
DOI10.1007/s00122-026-05320-8

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NARA Access Coverage1929-01-01~Current
Journal Homepagehttps://www.springer.com/journal/122
Publisher PageOpen Publisher Page
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