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Noise reliability evaluation of nanoscale metal-oxide-semiconductor field-effect transistors based on Monte Carlo simulation and soft computing

Xiaofei Jia; Qun Wei; Wenpeng Zhang; Han Wang; Liang He
Computer Physics Communications · Vol. 319 · pp. 109960 · 2026
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Bibliographic Information

JournalComputer Physics Communications
PublisherNorth-Holland
Publication Date2026-02-01
Publication Year2026
Volume319
Pages109960
Document TypeJournal Article
eISSN0010-4655
DOI10.1016/j.cpc.2025.109960
SubjectEarth and Planetary Sciences

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NARA Access Coverage1969-07-01~Current
Journal Homepagehttps://www.sciencedirect.com/science/journal/00104655
Publisher PageOpen Publisher Page
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