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Covalently bridged interface engineering for suppressing interfacial defects toward high-stability and low-voltage organic transistors and circuits

Jiannan Qi; Jialu Xue; Xufan Li; Zhongwu Wang; Yinan Huang; Yongxu Hu; Xiaosong Chen; Liqiang Li
Science Bulletin · Vol. 71, Issue 14 · pp. 3642-3650 · 2026
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Bibliographic Information

JournalScience Bulletin
PublisherElsevier
Publication Date2026-07-01
Publication Year2026
Volume71
Issue14
Pages3642-3650
Document TypeJournal Article
eISSN2095-9273
DOI10.1016/j.scib.2026.06.012
SubjectEarth and Planetary Sciences

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NARA Access Coverage2026-03-01~2026-03-01
Journal Homepagehttps://www.sciencedirect.com/science/journal/20959273
Publisher PageOpen Publisher Page
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