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Rapid detection of corn seed turtle cracks based on transmitted light image and deep learning method

He Li; Yun Hao; Weifeng Wu; Keling Tu; Yanan Xu; Han Zhang; Danyang Zhang; Mingliu Li; Riliang Gu; Qun Sun
Computers and Electronics in Agriculture · Vol. 230 · pp. 109876 · 2025
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Bibliographic Information

JournalComputers and Electronics in Agriculture
PublisherElsevier
Publication Date2025-03-01
Publication Year2025
Volume230
Pages109876
Document TypeJournal Article
eISSN0168-1699
DOI10.1016/j.compag.2024.109876
SubjectAgricultural and Biological Sciences

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NARA Access Coverage1985-10-01~Current
Journal Homepagehttps://www.sciencedirect.com/science/journal/01681699
Publisher PageOpen Publisher Page
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