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In-situ analysis of nitrogen stress in field-grown wheat: Raman spectroscopy as a non-destructive and rapid method

Zhen Gao; Daming Dong; Guiyan Yang; Xuelin Wen; Juekun Bai; Fengjing Cao; Chunjiang Zhao; Xiande Zhao
Computers and Electronics in Agriculture · Vol. 237 · pp. 110700 · 2025
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Bibliographic Information

JournalComputers and Electronics in Agriculture
PublisherElsevier
Publication Date2025-10-01
Publication Year2025
Volume237
Pages110700
Document TypeJournal Article
eISSN0168-1699
DOI10.1016/j.compag.2025.110700
SubjectAgricultural and Biological Sciences

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NARA Access Coverage1985-10-01~Current
Journal Homepagehttps://www.sciencedirect.com/science/journal/01681699
Publisher PageOpen Publisher Page
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