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Non-destructive measurement of soybean leaf thickness via X-ray computed tomography allows the study of diel leaf growth rhythms in the third dimension

Johannes Pfeifer; Michael Mielewczik; Michael Friedli; Norbert Kirchgessner; Achim Walter
Journal of Plant Research · Vol. 131, Issue 1 · pp. 111-124 · 2018
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Bibliographic Information

JournalJournal of Plant Research
PublisherSpringer
Publication Date2018-01-01
Publication Year2018
Volume131
Issue1
Pages111-124
Document TypeJournal Article
Print ISSN0918-9440
eISSN1618-0860
DOI10.1007/s10265-017-0967-8

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NARA Access Coverage1972-01-01~Current
Journal Homepagehttps://www.springer.com/journal/10265
Publisher PageOpen Publisher Page
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