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Journal Article

GGE biplot technique to delineate genotype × environment interactions to identify the stable resistance sources in the lentil—Stemphylium blight pathosystem

Shishir Rizal; Poly Saha
European Journal of Plant Pathology · Vol. 169, Issue 3 · pp. 555-567 · 2024

Abstract

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Bibliographic Information

JournalEuropean Journal of Plant Pathology
PublisherSpringer
Publication Date2024-07-01
Publication Year2024
Volume169
Issue3
Pages555-567
Document TypeJournal Article
Print ISSN0929-1873
eISSN1573-8469
DOI10.1007/s10658-024-02851-y

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NARA Access Coverage1895-01-01~Current
Journal Homepagehttps://www.springer.com/journal/10658
Publisher PageOpen Publisher Page
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